Design Patterns

Are Anti-patterns Coupled? An Empirical Study

Author(s): Wanwangying Ma, Lin Chen, Yuming Zhou, Baowen Xu, Xiaoyu Zhou
Venue: Software Quality, Reliability and Security (QRS), 2015 IEEE International Conference
Date: 2015

4
Quality

Documenting Design-Pattern Instances: A Family of Experiments on Source-Code Comprehensibility

Author(s): C. Gravino, M. Risi, G. Scanniello, and G Totora
Venue: International Conference on Software Engineering)
Date: 2015

4
Quality

Usability through Software Design

Author(s): Carvajal, L.; Moreno, A.M.; Sanchez-Segura, M.-I.; Seffah, A.
Venue: IEEE Transactions on Software Engineering
Date: 2013

4
Quality

Measuring the Quality of Design Pattern Detection Results

Author(s): Shouzheng Yang ; York Univ., Toronto, ON, Canada ; Manzer, A. ; Tzerpos, V.
Venue: International Conference on Software Engineering
Date: 2-6 March 2015

4
Quality

Do Visitor patterns improve design simplicity?

Author(s): A. Nanthaamornphong, R. Wetprasit
Venue: Software Engineering Conference (MySEC)
Date: 2014

4
Quality

Pattern Based Software Re-engineering: A Case Study

Author(s): William C. Chu, Chih-Wei Lu, J.P. Shiu, Xudong He
Venue: IEEE
Date: 1999

3
Quality

Do Security Patterns Really Help Designers?

Author(s): K. Yskout, R. Scandariato, W. Joosen
Venue: 2015 IEEE/ACM 37th IEEE International Conference on Software Engineering
Date: 2015

3
Quality

An Empirical Study on the Evolution of Design Patterns

Author(s): Lerina Aversano, GErardo Canfora, Luigi Cerulo, Concettina Del Grosso, Massimiliano Di Penta
Venue: ESEC/FSE, Dubrovnik, Croatia
Date: September 2007

3
Quality

Experience Using Design Patterns to Develop Reusable Object-Oriented Communications Software.

Author(s): Douglas C. Schmidt
Venue: Communications of the ACM, Vol. 38, No. 10
Date: October 1995

3
Quality

Design Patterns and Change Proneness: An Examination of Five Evolving Systems

Author(s): James M. Bieman, Greg Straw, Huxia Wange, P. Willard Munger, Roger T. Alexander
Venue: Ninth International Software Metrics Symposium
Date: 2003

3
Quality