Design Patterns

Pattern Based Software Re-engineering: A Case Study

Author(s): William C. Chu, Chih-Wei Lu, J.P. Shiu, Xudong He
Venue: IEEE
Date: 1999

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Do Security Patterns Really Help Designers?

Author(s): K. Yskout, R. Scandariato, W. Joosen
Venue: 2015 IEEE/ACM 37th IEEE International Conference on Software Engineering
Date: 2015

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Quality

An Empirical Study on the Evolution of Design Patterns

Author(s): Lerina Aversano, GErardo Canfora, Luigi Cerulo, Concettina Del Grosso, Massimiliano Di Penta
Venue: ESEC/FSE, Dubrovnik, Croatia
Date: September 2007

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Quality

Experience Using Design Patterns to Develop Reusable Object-Oriented Communications Software.

Author(s): Douglas C. Schmidt
Venue: Communications of the ACM, Vol. 38, No. 10
Date: October 1995

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Quality

Design Patterns and Change Proneness: An Examination of Five Evolving Systems

Author(s): James M. Bieman, Greg Straw, Huxia Wange, P. Willard Munger, Roger T. Alexander
Venue: Ninth International Software Metrics Symposium
Date: 2003

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Quality

Work Experience versus Refactoring to Design Patterns: A Controlled Experiment

Author(s): T.H. Ng, S.C. Cheung, W.K. Chan, Y.T. Yu
Venue: Special Interest Group on Software Engineering (SIGSOFT)
Date: November 2006

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Quality

Two Controlled Experiments Assessing the Usefulness of Design Pattern Documentation in Program Maintenance

Author(s): Lutz Prechelt, Barbara Unger-Maprecht, Michael Philippsen, Walter F. Tichy
Venue: IEEE Transactions On Software Engineering, Vol. 28, No. 6
Date: June 2002

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Do Design Patterns Improve Communication? An Experiment with Pair Design

Author(s): Barbara Unger, Walter F. Tichy
Venue: Proceedings of International Workshop on Empirical Studies of Software Maintenance
Date: May 2000

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Quality

Pattern-Based Design and Implementation of an XML and RDF Parser and Interpreter: A Case Study

Author(s): Gustaf Neumann, Uwe Zdun
Venue: unknown
Date: unknown

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Quality

A Controlled Experiment Comparing the maintainability of Programs Designed with and without Design Patterns – A replication in a

Author(s): Marek Vokac, Walter Tichy, Dag I.K. Sjoberg, Erik Arisholm, Magne Aldrin
Venue: 2003 Luwer Academic Publishers
Date: 2003

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