Testing

Configurations Everywhere: Implications for Testing and Debugging in Practice

Author(s): Dongpu Jin, Xiao Qu, Myra B. Cohen, Brian Robinson
Venue: ICSE '14
Date: 2014

4
Quality

A Learning-Based Method for Detecting Defective Classes in Object-Oriented Systems

Author(s): Çağıl Biray, Feza Buzluca
Venue: IEEE Eighth International Conference on Software Testing, Verification and Validation Workshops (ICSTW)
Date: 2015

4
Quality

Trivial Compiler Equivalence: A Large Scale Empirical Study of a Simple, Fast and Effective Equivalent Mutant Detection Technique

Author(s): Mike Papadakis, Yue Jia, Mark Harman, and Yves Le Traon
Venue: 37th IEEE International Conference on Software Engineering
Date: 2015

4
Quality

Reuse: Reducing Test Effort

Author(s): R. Tiwari, N. Goel
Venue: ACM SIGSOFT Software Engineering Notes
Date: March 2013

4
Quality

STAR: Stack Trace Based Automatic Crash Reproduction via Symbolic Execution

Author(s): Ning Chen, Sunghun Kim
Venue: IEEE Transactions on Software Engineering
Date: 2015

4
Quality

Empirically Detecting False Test Alarms Using Association Rules

Author(s): Kim Herzig, Nachiappan Nagappan
Venue: IEEE International Conference on Software Engineering
Date: 2015

4
Quality

Quality Experience: A Grounded Theory of Successful Agile Projects Without Dedicated Testers

Author(s): Lutz Prechelt, Holger Schmeisky, Franz Zieris
Venue: International Conference on Software Engineering
Date: 2016

4
Quality

An Industrial Survey on Contemporary Aspects of Software Testing

Author(s): Adnan Causevic, Daniel Sundmark, Sasikumar Punnekkat
Venue: International Conference on Software Testing, Verification and Validation
Date: 2010

4
Quality

Automated System Testing using Visual GUI Testing Tools: A Comparative Study in Industry

Author(s): E. Borjesson, R. Feldt
Venue: IEEE Fifth International Conference on Software Testing
Date: 2012

4
Quality

Challenges with Software Verification and Validation Activities in the Space Industry

Author(s): R. Feldt, R. Torkar, E. Ahmad, B. Raza
Venue: ICST 2010
Date: 2010

4
Quality