Testing

Holistic Model-Based Testing for Business Information Systems

Author(s): Michael Mlynarski
Venue: 2010 International Conference on Software Testing
Date: 2010

3
Quality

A Case Study of Automating User Experience-Oriented Performance Testing on Smartphones

Author(s): G. Canfora, F. Mercaldo, C.A. Visaggio, M. D'Angelo, A. Furno, C. Manganelli
Venue: IEEE Sixth International Conference on Software Testing, Verification and Validation
Date: 2013

3
Quality

Impact of CS programs on the quality of test cases generation: An empirical study

Author(s): Omar S. Gómez, Sira Vegas, Natalia Juristo
Venue: 2016 IEEE/ACM 38th IEEE International Conference on Software Engineering Companion
Date: May 2016

3
Quality

Is Mutation an Appropriate Tool for Testing Experiments?

Author(s): J. Andrews, L. Briand, L. Labiche
Venue: Proceedings of 2005 International Conference on Software Engineering
Date: May 2005

3
Quality

WHOSEFAULT: Automatic Developer-to-Fault Assignment through Fault Localization

Author(s): Francisco Servant, and James A. Jones
Venue: Proceedings of the 2012 International Conference on Software Engineering
Date: 2012

3
Quality

Repairing Selenium Test Cases: An Industrial Case Study about Web Page Element Localization

Author(s): M. Leotta, D. Clerissi, F. Ricca, C. Spadaro
Venue: IEEE Sixth International Conference on Software Testing, Verification and Validation (ICST)
Date: 2013

3
Quality

Impact of CS programs on the quality of test cases generation: An empirical study

Author(s): Omar S. Gómez, Sira Vegas, Natalia Juristo
Venue: 2016 IEEE/ACM 38th IEEE International Conference on Software Engineering Companion
Date: May 2016

3
Quality

Testing the Untestable

Author(s): Lionel Brand, Shiva Nejati, Mehrdad Sabetzadeh, Domenico Bianculli
Venue: International Conference on Software Engineering
Date: May 2016

3
Quality

An Empirical Comparison of Software Fault Tolerance and Fault Elimination

Author(s): T. Shimeall, N. Leveson
Venue: IEEE Transactions On Software Engineering, Vol. 17, No. 12
Date: February 1998

3
Quality

An Empirical Evaluation of Weak Mutation

Author(s): A. Offut, S. Lee
Venue: IEEE Transactions On Software Engineering, vol. 20, no. 5
Date: May 1994

3
Quality